New Items

Spectroscopic Equipment

Approx Price: Rs 55 Lakh / Piece(s) 
We are engaged in offering Spectroscopic Equipment/ Spectroscopic Ellipsometer for NPP, Dye. We offer the range of products Oxide film, Carbon film, Polarization state measurement - Retardation angle upon reflection, Optical activity, Anisotropy, Birefringence. Accurate multi-layer depth profile - Thickness, Density, Crystalline, Composition. Our products are appreciated by the clients.Product Details: • Place of Origin Korea • Brand Name Ellipsotech • Model Number SE -ElliPayment & Shipping Terms: • Price FOB USD 40000~50000 / Piece • Minimum Order Quantity 1 Piece/Pieces • Packaging Details As per international Standard • Delivery Time 30 - 40 days • Payment Terms L/C,T/T • Supply Ability 2 Piece/Pieces per Month

Spectroscopic Ellipsometer

Approx Price: Rs 55 Lakh / Piece(s) 
We are the supplier of Spectroscopic Ellipsometer to all our indian clients. Our product is a highly sensitive optical measurement technique that is used to analyze thin-layer stacks. And it is based on the observation that the polarized light reflected from the surface of the thin layer is used to calculate the thickness and other optical parameters. The products are highly appreciated from the clients in various research institutions.

Features:

  • Highest accuracy and sensitivity
  • Modular design;
  • Coated thickness / Surface roughness, anisotrophy / crystalinity etc.
  • Surface and interface roughness
  • Fully integrated software package for measurement, modelling and automatic operations
  • Mueller matrix
  • Depolarization

Specifications:

  • Thin film thickness: 1Å to 30 µm
  • Large spectral range: 240 - 800nm  - 2100 nm

Additional Information:
  • Item Code: 200

Spectroscopic Ellipsometer for Research Centers

Approx Price: Rs 55 Lakh / Piece(s) 
We also offer our clients a wide range of Spectroscopic Ellipsometer for Research Centers. Our products are highly appreciated by the clients and can be easily availed from the market.

Specifications:

  • Thin film thickness from 1Å to 30 µm
  • Large spectral range: 145-2100 nm
  • Mueller matrix
  • Depolarization

Features:

  • Highest accuracy and sensitivity
  • Modular design
  • Surface and interface roughness
  • Fully integrated software package for measurement, modelling and automatic operations
Looking for New Items ?
© Spektron Instruments Inc.
 
Desktop Site Back to top